Chairpersons : Radomir Kuzel (Uni Prague), René Guinebretiere (ENSCI Limoges)
Monday, September 4
Balzar Davor
14h00_14h25
INFLUENCE OF RESIDUAL STRESS ON SUPERCONDUCTING TRANSITION TEMPERATURE IN TUNGSTEN THIN FILMS FOR PHTON-COUNTING APPLICATIONS
Graat Peter
14h25_14h50
STRESS ANALYSIS OF POLYCRYSTALLINE, TEXTURED LAYERS: EXAMPLES FROM THE MICROELECTRONICS INDUSTRY
Krauss Christopher
14h50_15h15
FULLY INORGANIC DEPOSITION OF NACRE-LIKE LAYERS ON TITANIUM FOILS FOR IMPLANTATION
Pantleon Karen
15h15_15h40
IN-SITU X-RAY DIFFRACTION STUDY OF (SELF-) ANNEALING IN NANOCRYSTALLINE ELECTRODEPOSITS
Bachelet Romain
15h40_16h05
HIGH RESOLUTION X-RAY DIFFRACTION CHARACTERIZATION OF THE EPITAXIAL TILT OXIDE NANO-ISLANDS CROWN ON VICINAL SURFACES
Bezdička Petr
poster
CRYSTALLIZATION KINETICS OF AMORFOHOU CHALCOGENIDE FILMS
Paszkowicz Wojciech
REFLECTOMETRIC STUDY OF NSMO/YBCO SUPERLATTICES
Daniš Stanislav
DIFFUSE X-RAY SCATTENG IN GRADED SiGe/Si (001) LAYERS USING TERSOFF MODEL
Horák Lukáš
POWDER X-RAY DIFFRACTION FROM MULTILAYER IN A GRAZING-INCIDENCE NON-COPLANAR GEOMETRY
Doyle Stephen
INFLUENCE OF PROCESSING PARAMETERS ON THE STRUCTURE OF GALVANICALLY DEPOSITED POLYCRYSTALLINE GOLD AND GOLD-ALLOY LAYERS: A SYNCHROTRON XRD STUDY
Ducu Catalin
MICROSTRUCTURES CHARACTERIZATION OF PROTECTIVE SURFACES OF NUCLEAR STEELS
Gressmann Thomas
SIMULTANEOUS DETERMINATION OF CONCENTRATION- AND STRESS DEPTH-PROFILES IN HEXAGONAL E-IRON-NITRIDE COMPOUND LAYERS
Kryshtab Tetyana
APPLICATION OF EXTINCTION FOR MICROSTRUCTURE DETERMINATION OF TEXTURED THIN FILMS
Tomov Ivan
SECONDARY EXTINCTION CORRECTION USED IN A NOVEL METHOD FOR IMPROVED XRD CHARACTERIZATION OF TEXTURED MATERIALS. THE CASE OF THIN FILMS
Kužel Radomír
GROWTH OF NANOCRYSTALLINE MAGNETRON SPUTTERED TiO2 THIN FILMS STUDIED BY X-RAY SCATTERING
Nichtová Lea
STUDY OF CRYSTALLIZATION OF MAGNETRON SPUTTERED TiO2 THIN FILMS BY X-RAY SCATTERING
MS14-P152
Vermeulen Arnold
MEASUREMENT STRATEGIES FOR THE ANALYSIS OF RESIDUAL STRESS IN POLYCRYTALLINE COATINGS